Theory and practice behind picking, handling and positioning nanoparticles in the SEM.
Pick and place. Micro-gripper for micron scale objects manipulation.
Computer assisted micro object manipulation.
Measurement of transistor characteristics with SEM nanoprobing technique.
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Characterization of the piezoelectric response of nanowires for the design of force sensors
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Semi-automatic wafer-level electrical measurements.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into MEMS cantilevers.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Localized I-V characterization of PV cells under monochromatic illumination.
I-V characterization of graphene based TFTs
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Deformation of an AFM cantilever observed at the SEM.
Nanometer precision optical fiber positioner.
Electrical testing of LED or other electronic components.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy