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TEM sample preparation

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Manipulation with a miBot micromanipulator of 80 nm nanowires inside a Scanning Electron Microscope (SEM). The nanowires are placed on a grid which is then used in a Transmission Electron Microscope (TEM) for observations at ultra high resolutions. The ability of the miBot micromanipulator to combine nanometer resolution of positioning with large traveling range drastically simplifies the preparation of samples.

Handling of nanowires

The video below is another example showing two miBot nanomanipulators operated to extract nanowires from a large bundle and contact them with sharp tungsten probes. Motions are in real-time, demonstrating the rapidity and precision of the procedure as well as the vibration free displacements even at high optical magnifications. This is further exemplified with the transfer of nanowires from one probe to another.

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Imina Technologies' application engineer shows a colleague how to land probes on nanoscale contacts for in-situ SEM transistor characterization.