TEM Sample Preparation

Manipulation with a miBot micromanipulator of 80 nm nanowires inside a Scanning Electron Microscope (SEM). The nanowires are placed on a grid which is then used in a Transmission Electron Microscope (TEM) for observations at ultra high resolutions. The ability of the miBot micromanipulator to combine nanometer resolution of positioning with large traveling range drastically simplifies the preparation of the sample.