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Probes, Micro-Tools & Sensors




Depending on your application, several micro-tools can be used with the miBot. Typically, for nanomanipulation experiments, sharp tips (nm ∅), STM tips (nm ∅ in tungsten), and AFM probes (different configurations and coatings) are prepared assembled on a small prop, enabling a fast and easy mounting onto the miBot arm.

For electrical characterization of samples and probing integrated circuits, sharp tips (nm ∅) and test probe tips (µm ∅) are proposed mounted on the miBot BT-10p. (Only available with the electrical probing option for the miBot(s) and the base. Learn more)

  • Our solutions
  • Platforms for Optical & Electron Microscopes
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  • Micro & Nanomanipulator miBot BT-10
  • Standard Platform Base miBase BS-40
  • Compact Base miCube CB-10
  • Piezoelectric Amplifier syDrive SD-10
  • User Interface software + joystick
  • Options
  • Positioning Stage XY-13-OL
  • Electrical Probing
  • Probes & Micro-Tools

Download product brochure

Compatible Tools

  • Test probe tips (µm ∅)
  • STM tips (nm ∅)
  • AFM probes
  • Force sensors
  • Optical fibers

Examples of use

Bending of Nanowires
LED testing
Wafer probing
Single cell manipulation
TEM Sample Preparation
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