Advanced Electrical Failure Analysis (EFA) capabilities, such as multichannel color-coded EFA and quantitative signal acquisition, are enabled by in-situ pre-amplifiers. Signal from each probe is collected and amplified in-situ by these pre-amplifiers with calibrated gain.
In this technical paper, we discuss and show examples of low-noise signal acquisition, live color-coding of EFA signals by probe or current direction, quantitative measurements, and image math helping to unmask admixed signals.
Advanced EFA with color coded multi-channel nanoprobing
Scan-assisted lock-in RCI on low-resistance samples
Multi-channel EBIC on 7nm technology node: revealing hidden signals
EBIC measurement of the minority carriers’ diffusion length in a GaAs solar cell p-n junction
We have fully equipped demo lab for semiconductor electrical failure analysis. Our applications team is eager to perform live demonstrations and feasibility studies for you, onsite or online.
In the meantime, do not miss the opportunity to learn more about our products and applications with one of our webinars!
