Filter by:
Electrical characterization and EFA (EBIC and EBAC) used to detect and locate failures in semiconductor devices.
Electron Failure Analysis Probing Electronics

EBIC / EBAC techniques for semiconductor failure analysis

Five miBot nano probers landed on 100 nm flash memory bits contacts to find a failing bit and to understand its malfunction.
Electron Failure Analysis Probing Electronics

Nanoprobing on a faulty memory bit

Electron Failure Analysis Electronics

Identifying origins of EBIRCh contrast

59 nm failing spot in a leaky 130 tech node transistor detected using Electron Beam Induced Resistance Change (EBIRCh).
Electron Failure Analysis Probing Electronics

Defect localization at transistor gate using EBIRCh

Electron Probing Electronics Materials Science

Combined AFM and nanoprobing

Precise circuit editing: deposition of 1 kOhm pull-up resistor by a FIB using in-situ nano probing on a tilted stage
Electron Failure Analysis Probing Electronics

Circuit editing for IC debug

EBIC signal on AIGaN/GaN HEMT used to understand issues with threshold voltage, non-uniformity, damaged p-n junctions.
Electron Failure Analysis Probing Electronics Materials Science

EFA of high electron mobility transistors

In-situ SEM EBIC characterization of p-n junctions in a semiconductor chip cross-section.
Electron Failure Analysis Probing Electronics

Cross-section EBIC of a transistor array

Observation under a SEM to monitor the deformation of an AFM cantiveler. A miBot is employed to deform the AFM.
Electron Manipulation Electronics

MEMS / NEMS mechanical testing

IV curves for 180 nm tech node PMOS transistor at temperatures of -30, 75, 150°C reached by a heating and cooling stage.
Electron Failure Analysis Probing Electronics Materials Science

Thermal behavior of a PMOS transistor

Nanoprober tip pushinga a sub-200 nm-diameter, 50-micrometer-long single-crystal silicon nanowire resonator to fracture.
Electron Manipulation Probing Electronics

Characterization of SiNW based NEMS resonator

Ohmic contacts on ZnO nanowire fabricated by e-beam lithography on individual wires prepositioned in-situ by nano probes.
Optical Manipulation Electronics Photonics

Nanowires micromanipulation

Because seeing is believing!

We have fully equipped demo lab for semiconductor electrical failure analysis. Our applications team is eager to perform live demonstrations and feasibility studies for you, onsite or online.

Book your demo today!

In the meantime, do not miss the opportunity to learn more about our products and applications with one of our webinars!

Register to a webinar

Imina Technologies' application engineer shows a colleague how to land probes on nanoscale contacts for in-situ SEM transistor characterization.