Best in class Electrical Failure Analysis (EFA) system for your electron microscope.
Perform quantitative EBIC, EBAC/RCI and EBIRCh to precisely localize and characterize defects in semiconductor chips.
Best in class Electrical Failure Analysis (EFA) system for your electron microscope.
Perform quantitative EBIC, EBAC/RCI and EBIRCh to precisely localize and characterize defects in semiconductor chips.
Our solutions are distributed worldwide through our network of qualified partners. We are here to support you! Get in touch with us, we are committed to assist you in selecting the products that best meets your needs.