From Oct. 4 to 8, 2021
The 32nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will be held virtually.
This international symposium continues to focus on recent developments and future directions in quality and reliability management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
More information on the event website.