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IPFA 2021

From Sep. 1 to 3, 2021

The 28th edition of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) will be held virtually in this September. 

IPFA will continue to focus on the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear-out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device/circuit/module failure that serves as critical input for future design for reliability.

More information on the event website.