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Next generation Electrical Failure Analysis with Nanoprobing

Held on May. 10, 2021 at 09:00 PST

Together with our partners from point electronic GmbH, we will present our new combined solution for Electrical Failure Analysis (EBIC/EBAC/EBIRCh) and Nanoprobing.

Dr. Grigore Moldovan (CTO at point electronic) and Mr. William Courbat (Application Engineer at Imina Technologies) will give an insight into the motivation behind the latest developments, and introduce the key benefits of the new hardware and software. A system will be at hand to illustrate the user experience with live demonstrations.

Register today and join us to discover this exciting solution that will define a new standard of features and performances in Electrical Failure Analysis workflows!


For attendees from Asian and European continent, please register to the associated event for your time zone.


Registration closed on 23.04.2021 à 0:00