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IPFA 2023

From Jul. 24 to 27, 2023 in Penang, Malaysia

The 30th edition of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2023) will continue to focus on the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear-out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device/circuit / module failure that serves as a critical input for future design for reliability.