Held on Mar. 13, 2024 in Online
Nanoindentation combined with in-situ SEM electrical nanoprobing can yield important insights into the effects of mechanical pressure and deformation on electrical properties on the smallest scales. Measuring the displacement caused by electrical bias can be also useful.
Two swiss high-precision instrumentation companies Alemnis and Imina Technologies developed an integrated solution for simultaneous nanoprobing and nanoindentation inside the SEM. This integration was done in the framework of the In-situ Microscopy Alliance.
In our 30-minutes webinar, we will present the integration of Imina Technologies electrical nanoprobers into the Alemnis ASA nanoindentor and show a few application examples such as the deformation of an actuated piezoresistive AFM cantilever and a change of electrical current passing through a deformed PtCr metal line.
We are looking forward to seeing you at our webinar!
Two sessions are available:
