News

Imina Technologies microprobers integrated into Park Systems FX 200 AFM
June, 2026

Imina probers integrated into Park Systems FX200 AFM

High-resolution AFM with multi-electrode electrical contact for real-time biasing.
May, 2026

In-situ preamplifiers: key ingredient to the state-of-the-art EFA

Learn what is behind the advanced EFA capabilities.
December, 2025

New Nanoprobing Platform for high‑voltage applications

We are releasing our new Nanoprobing High-Voltage Platform designed to safely apply voltages up to 1 kV.
September, 2025

Scan-assisted lock-in EFA on low-resistance samples

New feature significantly improves SNR of the RCI signal.
May, 2025

Combined in-situ SEM mechanical and electrical testing at nanoscale

Interview with Dr. Rajaprakash Ramachandramoorthy.
Vacuum Transfer Module simplifies nanoscale electrical characterization of air-sensitive samples
April, 2025

Vacuum transfer module for air-sensitive samples

Easy transfer of air-sensitive samples from a glovebox into the SEM chamber.
February, 2025

Nanoprobing combined with SEM imaging SiOx anodes

Reveals the mechanism of the capacity decay.
Guillaume Boetsch and Christophe Sichting shake hands for the signed agreement and new milestone in Imina Technologies and point electronic partnership
December, 2024

Milestone in our partnership

Imina Technologies is now the exclusive supplier of point electronic Electrical Failure Analysis solutions.
November, 2024

Understanding Failure in InGaAs/GaAs Lasers

Photonic integrated circuits quality assurance.
November, 2024

15 Years of innovation and partnership

Sales Meeting with our global partners.