NANO Product Line
MICRO Product Line
Strategies to identify physical origins of contrast in EBIRCH
Thermal stage helps to better understand the signal.
In-situ SEM measurement of thermal behavior of a PMOS transistor
Featuring our thermal stage.
EBIC measurement of the minority carriers’ diffusion length in a GaAs solar cell p-n junction
Quantitative EBIC on GaAs solar cell p-n junction. Calibrated EBIC signal acquisition enables the measurement of minority carriers’ diffusion length.
Origins of leakage currents in nanowire array solar cells
Solar cells based on radial-junction nanowires: how nanowire-to-nanowire inhomogenity affects their performance and how to improve it?
NANO+ for safer and faster probe landing
Launch of the Robot NANO+ with an extended fine-mode range in Z of 15 µm!
A new form of carbon structures: micropyramids made of soot nanoparticles
Our in-situ SEM solution was used to measure the tunneling current from carbon micropyramids to characterize their field-emission properties
Preparing MIEC Nanofibers for a TEM Study
Imina Technologies’ Nanoprobing solution used for in-situ SEM nanofiber manipulation.
miBots used in combination with EFA techniques at KIST
Nanoprobing combined with EBIC/EBAC helps to reveal charge carrier dynamics in perovskite solar cell and to study electrical conductivity in battery materials.
miBots used to actuate MEMS
SEM imaging used to detect sub-100 nm or high-frequency in-plane MEMS motion.
Partnership with Eurofins MASER
Imina Technologies and Eurofins MASER join forces to offer top-level service in Nanoprobing and Electrical Failure Analysis.