News

December, 2020

EBIRCh for defect localization

New use case about the Electron Beam Induced Resistance Change technique.
December, 2020

IMINA new website is live!

A complete redesign and new content to better serve you.
August, 2020

New product: Large Sample Adapter

Release of the Large Sample Adapter option for nanoprobing and FA.
June, 2020

Distribution in Finland

Finfocus Instruments Oy will deal with sales and support for Finland.
November, 2019

New logo for our 10 years!

For our 10 years anniversary, we are very excited to unveil our new logo!
October, 2019

Fast and accurate failure analysis at FIB tilt angle: article in EDFA magazine

The November 2019 issue of the Electronic Device Failure Analysis (EDFA) magazine features the article Faster and more accurate failure analysis: circuit editing and short localization performed at same FIB tilt angle using multiple techniques, a joint publication from Imina Technologies, Switzerland and Fraunhofer IMWS, Germany.
September, 2019

Successful distributor sales meeting 2019

Awesome days here in Lausanne with our distributors from all over the world! Lots of constructive exchanges and experience sharing to better serve our customers.
February, 2019

Angstrom Scientific appointed distributor in the USA

Imina Technologies partners with Angstrom Scientific Inc. to expand its sales and service network in the USA.
July, 2018

10 nm technology CMOS characterized with SEM-based miBot™ nanoprobers

The versatile nanoprobing solutions from Imina Technologies were successfully used to characterize CMOS transistors of commercial microprocessors with technology nodes 22, 14, and 10 nm.