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News
March, 2023
Partnership with Eurofins MASER
Imina Technologies and Eurofins MASER join forces to offer top-level service in Nanoprobing and Electrical Failure Analysis.
February, 2023
The In-situ Microscopy Alliance
Alemnis, Imina Technologies, NenoVision and point electronic form an alliance to jointly provide in-situ characterization tools, solutions and services.
February, 2023
Speed up in situ SEM electrical nanoprobing
Threefold speed-up in the characterization of 7 nm transistors using a substage.
February, 2023
Manipulation and probing in a desktop SEM
Quick and precise microprobing inside a desktop SEM now available.
January, 2023
New distributor in the UK and Ireland
Scanwel Ltd is now our exclusive distributor in the UK and Ireland.
December, 2022
5nm transistor characterization
New application note about electrical nanoprobing of NMOS and PMOS transistors of a 5 nm technology node chip.
August, 2022
New distributor in Israel
Picotech appointed as exclusive distributor for Imina Technologies’ product in Israel.
July, 2022
New demo lab in Singapore at WinTech Nano
Top in-situ SEM nanoprobing and electrical failure analysis system is now available in Singapore at WinTech Nano for demonstrations and services.
May, 2022
New product: Thermal Stage for NANO product line
Thermal Stage for temperature-dependent nanoprobing and EFA.
April, 2022
Electrical characterization of 7 nm technology node chips
Imina Technologies’ Nanoprobing Solution used to characterize NMOS and PMOS transistors of a 7 nm technology node chip.
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