News
November, 2024

15 Years of innovation and partnership

Sales Meeting with our global partners.
Industrial infrastructure and reliability checks developed for creating wafers with new semiconductor technology nodes
July, 2024

Paving way for the 1.4nm technology node transistors

1 year into the 14AMI Chips JU project.
June, 2024

Nanoprobing combined with cathodoluminescence spectroscopy inside SEM

Integrated setup from Attolight and Imina Technologies.
Using resistive contrast imaging – an in-situ SEM electrical failure analysis technique – to localize defects in faulty metal-insulator-metal capacitors to troubleshoot the failure mechanism
May, 2024

Nanoprobing on conducting PEDOT:PSS gels

4-point measurements of charge transfer across a single pore wall.
US Workshops on correlative in-situ electron microscopy techniques for semiconductor devices and functional materials
April, 2024

IMA workshops across the US

First in-person workshops by In-situ Microscopy Alliance.
Using resistive contrast imaging – an in-situ SEM electrical failure analysis technique – to localize defects in faulty metal-insulator-metal capacitors to troubleshoot the failure mechanism
March, 2024

Spotting shorts

Using RCI to precisely locate leaking spots in a capacitor dielectric.
February, 2024

MICRO probe station

An all-rounder tool for any lab.
Nanoprobing on a transistor imaged by an electron microscope with color coding of signal coming from each nano probe
January, 2024

Advanced EFA with color coded multi-channel nanoprobing

Multi-channel nanoprobing enables color-coded EFA of devices with complex architecture.
December, 2023

Nanoindentation combined with nanoprobing inside the SEM

Imina Technologies and Alemnis present an integrated solution.
miBots integrated with Bruker AFM
December, 2023

Advanced AFM with simultaneous electrical probing

Complex analysis of various materials and in-situ AFM of operating or actuated devices.