At our recent workshop in Singapore, we welcomed more than 50 semiconductor failure analysis engineers from across Southeast Asia. Due to high demand, we even extended the event to two days to accommodate the attendees eager to participate in the live demo.
The workshop was on the latest developments in nanoprobing and electrical failure analysis, held together with our partners from point electronic, ibss Group, Inc. and Tektronix ASEAN-ANZ.
We are grateful to the Wintech-Nano Technology Services Pte. Ltd. facility for hosting the workshop and our Singapore demo lab. A special thanks goes to our partners from Crest Group for their support in organizing this workshop.
During the live demo sessions, our application engineer
Willy Lim showed the participants how Imina’s solutions streamline electrical characterization of semiconductor devices inside the SEM.
Willy also showed how to find defects using EBIC, EBAC, RCI, and EBIRCh, all possible with our EFA module, developed jointly with point electronic GmbH.
The live demo was followed by a very active Q&A session. We thank all attendees for their curiosity, enthusiasm, and interesting questions. We are excited to see so much interest in nanoprobing and EFA in Southeast Asia!
