News

Vacuum Transfer Module simplifies nanoscale electrical characterization of air-sensitive samples
April, 2025

Vacuum Transfer Module for Air-Sensitive Samples

Easy transfer of air-sensitive samples from a glovebox into the SEM chamber
February, 2025

Nanoprobing combined with SEM imaging SiOx anodes

Reveals the mechanism of the capacity decay.
Guillaume Boetsch and Christophe Sichting shake hands for the signed agreement and new milestone in Imina Technologies and point electronic partnership
December, 2024

Milestone in our partnership

Imina Technologies is now the exclusive supplier of point electronic Electrical Failure Analysis solutions.
November, 2024

Understanding Failure in InGaAs/GaAs Lasers

Photonic integrated circuits quality assurance.
November, 2024

15 Years of innovation and partnership

Sales Meeting with our global partners.
October, 2024

Pick up and transfer of single microcrystals for X-Ray diffraction

How miBots can be useful for chemists?
September, 2024

Electrical characterization of self-assembled 1D Au chains

Directly assessing electrical transport through a nanoparticles chain.
August, 2024

Strain effect on thermal conductivity of 3C-SiC nanowires

miBots used to pick-up, transfer, and bend nanowires.
Industrial infrastructure and reliability checks developed for creating wafers with new semiconductor technology nodes
July, 2024

Paving way for the 1.4nm technology node transistors

1 year into the 14AMI Chips JU project.
June, 2024

Nanoprobing combined with cathodoluminescence spectroscopy inside SEM

Integrated setup from Attolight and Imina Technologies.