News

November, 2019

New logo for our 10 years!

For our 10 years anniversary, we are very excited to unveil our new logo!
October, 2019

Fast and accurate failure analysis at FIB tilt angle: article in EDFA magazine

The November 2019 issue of the Electronic Device Failure Analysis (EDFA) magazine features the article Faster and more accurate failure analysis: circuit editing and short localization performed at same FIB tilt angle using multiple techniques, a joint publication from Imina Technologies, Switzerland and Fraunhofer IMWS, Germany.
September, 2019

Successful distributor sales meeting 2019

Awesome days here in Lausanne with our distributors from all over the world! Lots of constructive exchanges and experience sharing to better serve our customers.
February, 2019

Angstrom Scientific appointed distributor in the USA

Imina Technologies partners with Angstrom Scientific Inc. to expand its sales and service network in the USA.
July, 2018

10 nm technology CMOS characterized with SEM-based miBot™ nanoprobers

The versatile nanoprobing solutions from Imina Technologies were successfully used to characterize CMOS transistors of commercial microprocessors with technology nodes 22, 14, and 10 nm.