News
September, 2024

Electrical characterization of self-assembled 1D Au chains

Directly assessing electrical transport through a nanoparticles chain.
August, 2024

Strain effect on thermal conductivity of 3C-SiC nanowires

miBots used to pick-up, transfer, and bend nanowires.
Industrial infrastructure and reliability checks developed for creating wafers with new semiconductor technology nodes
July, 2024

Paving way for the 1.4nm technology node transistors

1 year into the 14AMI Chips JU project.
June, 2024

Nanoprobing combined with cathodoluminescence spectroscopy inside SEM

Integrated setup from Attolight and Imina Technologies.
Using resistive contrast imaging – an in-situ SEM electrical failure analysis technique – to localize defects in faulty metal-insulator-metal capacitors to troubleshoot the failure mechanism
May, 2024

Nanoprobing on conducting PEDOT:PSS gels

4-point measurements of charge transfer across a single pore wall.
US Workshops on correlative in-situ electron microscopy techniques for semiconductor devices and functional materials
April, 2024

IMA workshops across the US

First in-person workshops by In-situ Microscopy Alliance.
Using resistive contrast imaging – an in-situ SEM electrical failure analysis technique – to localize defects in faulty metal-insulator-metal capacitors to troubleshoot the failure mechanism
March, 2024

Spotting shorts

Using RCI to precisely locate leaking spots in a capacitor dielectric.
March, 2024

Workshop in Singapore

Our latest developments in nanoprobing and electrical failure analysis
February, 2024

MICRO probe station

An all-rounder tool for any lab.
Nanoprobing on a transistor imaged by an electron microscope with color coding of signal coming from each nano probe
January, 2024

Advanced EFA with color coded multi-channel nanoprobing

Multi-channel nanoprobing enables color-coded EFA of devices with complex architecture.