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In-Situ Microscopy Alliance Workshop @Covalent Metrology

Held on Apr. 23, 2024 from 09:00 to 15:30 PST in Covalent Metrology, 923 Thompson place, Sunnyvale CA, 94085

This 1-day workshop is a unique opportunity to meet In-situ Microscopy Alliance: Alemnis, Imina, Nenovison and point electronic. You will learn about existing in-situ solutions, including integrations for correlative in-situ SEM analysis (nanoindentation + electrical nanoprobing, electrical failure analysis, AFM-in-SEM, etc) and hear about applications from the users. 

Number of participants is limited to 30.

Register using the form below.

Tentative Program

09:00 – 09:45   Registration and Coffee

09:45 - 10:00   Introduction of Covalent Metrology and the In-situ Microscopy Alliance (IMA)

10:00 - 10:30   Recent innovation in small-scale in-situ mechanical properties testing, Dr. Nicholas Randall, Alemnis

10:30 - 11:00   Investigating Fracture Toughness of Architected Materials at the Micro-scale, Abdulaziz Alrashed, University of Washington

11:00 - 11:15   Break and networking

11:15 - 11:45   Latest updates in electro-optical characterizations and failure analysis, Mr. Karl Boche, Imina Technologies

11:45 - 12:15   Metal layers short localization with EBAC and FIB circuit modifications, Mr. Karl Boche

12:15 - 13:30   Lunch

13:30 - 14:00   AFM-in-SEM - step forward for in-situ correlative microscopy, technology and applications, Mr. Jan Neuman NenoVision

14:00 - 14:30   Benefits of AFM-in-SEM for applications in semiconductor failure analysis and battery research, Mr. Jan Neuman, NenoVision

14:30 - 15:30   Lab tour, open discussion, end of the semina

Workshop Program

Registration closed on 22.04.2024 à 0:00