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Electron Failure Analysis Probing Electronics

EBIC / EBAC techniques for semiconductor failure analysis

Electron Failure Analysis Probing

Femtofarad Capacitance-Voltage measurement

Optical Manipulation Electronics Photonics

Nanowires micromanipulation

Electron Failure Analysis Probing Electronics

Defect localization at transistor gate using EBIRCh

Electron Failure Analysis Probing Electronics

Circuit editing for IC debug

Electron Failure Analysis Probing Electronics Materials Science

EFA of High Electron Mobility Transistors

Electron Manipulation Materials Science

In situ nanomanipulation in SEM

Electron Failure Analysis Probing Electronics

Electrical nanoprobing on 22, 14, and 10 nm devices

Optical Manipulation Photonics

Fiber optic positionning

Optical Probing Electronics

MicroLED electrical testing

Electron Failure Analysis Probing Materials Science

Thermal Stage for temperature-dependent nanoprobing

Electron Manipulation Probing Electronics

Characterization of SiNW based NEMS resonator

Electron Manipulation Electronics

MEMS / NEMS mechanical testing

Optical Manipulation Materials Science

Micro-particles manipulation and sorting

Because seeing is believing!

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