We offer high-precision robotic solutions to interact with and characterize samples down to the nanometer scale. Based on a unique motion technology, positioning probes with our robots and maintaining stable electrical contacts has never been so easy. The high modularity of our solutions provides considerable flexibility for deep integration with a variety of microscopy and test equipment, enabling efficient measurement workflows.
Integrated circuits, wafers, MEMS, or nanowires, whatever the samples and the measurements, our solutions adapt and fasten the time to critical data to help you achieve your experimental goals.
Electrical ProbingMeasure the electrical properties of semiconductor devices on the smallest technology nodes.
Failure AnalysisLocalize defects at contact levels and metal lines and increase semiconductor chips reliability.
ManipulationIsolate single particles, perform assemblies, or prepare samples for further investigations.
Imina Technologies’ modular robotic platforms are designed to fit all kind of scanning electron microscopes and optical setups. Probing at MICRO and NANO scales becomes truly convenient.
In situ nanoprobing and electrical failure analysis solutions for your SEM, FIB or dual beam.
Microprobing solutions for your optical microscope, probe station or inspection tool.
Precisio™ software is making the user experience truly intuitive. All required controls and parameters are embedded into a streamlined workflow with step by step operator assistance to perform your measurements in the most effective way. Features include:
Our solutions are distributed worldwide through our network of qualified partners. We are here to support you! Get in touch with us, we are committed to assist you in selecting the products that best meets your needs.
