Applications

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SEM image of two nanoprobes in contact with mesocrystal formation to characterize its electrical properties.
Electron Manipulation Probing Electronics Materials Science

Electronic properties of mesocrystals
Electron Probing Electronics Materials Science

Combined AFM and nanoprobing
EBIC signal on AIGaN/GaN HEMT used to understand issues with threshold voltage, non-uniformity, damaged p-n junctions.
Electron Failure Analysis Probing Electronics Materials Science

EFA of high electron mobility transistors
Nano probers and a nanoindentor in contact with a metal line inside an SEM to measure transport change upon indentation.
Electron Probing Materials Science

Nanoindentation combined with nanoprobing
Nanomanipulation of individual nanowires using electrostatic forces in-situ SEM
Electron Manipulation Materials Science

In situ nanomanipulation in SEM
A 3D-printed metallic microspring is compressed by a miBot nanoprober tip inside a Phenom tabletop electron microscope.
Electron Manipulation Probing Electronics Materials Science

Probing microsprings inside a desktop SEM
Manipulation of a single Gd-doped ceria (MIEC) nanofiber inside SEM to prepare for TEM electrochemical measurements.
Electron Manipulation Materials Science

Manipulation of MIEC nanofibers
Semi-automated robotic manipulation of micron-scale biological samples with end-effectors under an optical microscope.
Optical Manipulation Materials Science

Robots cooperation for microparticles manipulation
Electrical characterization of individual piezoelectric GaN nanowire under a digital optical microscope.
Optical Materials Science

Piezoelectric response of GaN nanowires characterization
Nanometer-scale manipulations on nanowires with nanoprobers in a SEM and a TEM.
Electron Manipulation Materials Science

TEM sample preparation
Heating and cooling stage for in-situ SEM nano probing to study semiconductor devices temperature-dependent behavior
Electron Failure Analysis Probing Materials Science

Thermal stage for temperature-dependent nanoprobing
Hexagonal array of self-assembled soot nanoparticles grown on a carbon microtube surface characterized by nanoprobing.
Electron Failure Analysis Probing Materials Science

Field-emitting properties of carbon micropyramids
IV curves for 180 nm tech node PMOS transistor at temperatures of -30, 75, 150°C reached by a heating and cooling stage.
Electron Failure Analysis Probing Electronics Materials Science

Thermal behavior of a PMOS transistor
Microgrippers and microprobes move Barium Titanate microparticles with a diameter ranging from 10 to 30 micrometers.
Optical Manipulation Materials Science

Micro-particles manipulation and sorting

Because seeing is believing!

We have fully equipped demo lab for semiconductor electrical failure analysis. Our applications team is eager to perform live demonstrations and feasibility studies for you, onsite or online.

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Imina Technologies' application engineer shows a colleague how to land probes on nanoscale contacts for in-situ SEM transistor characterization.