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In-Situ Microscopy Alliance Workshop @MIT

Held on Apr. 25, 2024 from 09:00 to 15:00 EST in 12-0168, MIT.nano (basement level), Building 12 60 Vassar Street. Cambridge, MA

This 1-day workshop is a unique opportunity to meet In-situ Microscopy Alliance: Alemnis, Imina, Nenovison and point electronic. You will learn about existing in-situ solutions, including integrations for correlative in-situ SEM analysis (nanoindentation + electrical nanoprobing, electrical failure analysis, AFM-in-SEM, etc) and hear about applications from the users. 

Number of participants is limited to 40.

Register using the following link: Workshop registration

Tentative Program

09:00 - 09:45   Registration and Coffee

09:45 - 10:00   Introduction of the In-situ Microscopy Alliance (IMA)

10:00 - 10:30   Recent innovation in small-scale in-situ mechanical properties testing, Dr. Nicholas Randall, Alemnis

10:30 - 11:00   Mechanics of architected materials through the lens of in situ characterization, Prof. Carlos Portela, MIT

11:00 - 11:15   Break and networking

11:15 - 11:45   Latest updates in electro-optical characterizations and failure analysis, Mr. Karl Boche, Imina Technologies

11:45 - 12:15   Metal layers short localization with EBAC and FIB circuit modifications, Mr. Karl Boche

12:15 - 13:30   Lunch

13:30 - 14:00   AFM-in-SEM - step forward for in-situ correlative microscopy, technology and applications, Mr. Jan Neuman NenoVision

14:00 - 14:30   Benefits of AFM-in-SEM for applications in material science and battery research, Mr. Jan Neuman, NenoVision

14:30   End of the seminar, open discussion

Workshop Program