Held on Apr. 25, 2024 from 09:00 to 15:00 EST in 12-0168, MIT.nano (basement level), Building 12 60 Vassar Street. Cambridge, MA
This 1-day workshop is a unique opportunity to meet In-situ Microscopy Alliance: Alemnis, Imina, Nenovison and point electronic. You will learn about existing in-situ solutions, including integrations for correlative in-situ SEM analysis (nanoindentation + electrical nanoprobing, electrical failure analysis, AFM-in-SEM, etc) and hear about applications from the users.
Number of participants is limited to 40.
Register using the following link: Workshop registration
Tentative Program
09:00 - 09:45 Registration and Coffee
09:45 - 10:00 Introduction of the In-situ Microscopy Alliance (IMA)
10:00 - 10:30 Recent innovation in small-scale in-situ mechanical properties testing, Dr. Nicholas Randall, Alemnis
10:30 - 11:00 Mechanics of architected materials through the lens of in situ characterization, Prof. Carlos Portela, MIT
11:00 - 11:15 Break and networking
11:15 - 11:45 Latest updates in electro-optical characterizations and failure analysis, Mr. Karl Boche, Imina Technologies
11:45 - 12:15 Metal layers short localization with EBAC and FIB circuit modifications, Mr. Karl Boche
12:15 - 13:30 Lunch
13:30 - 14:00 AFM-in-SEM - step forward for in-situ correlative microscopy, technology and applications, Mr. Jan Neuman NenoVision
14:00 - 14:30 Benefits of AFM-in-SEM for applications in material science and battery research, Mr. Jan Neuman, NenoVision
14:30 End of the seminar, open discussion
