Detecting in-plane movements in electrically actuated microelectromechanical systems (MEMS) can be a challenge, especially if the motion range is in nanometer range, or high in frequency. Low contrast with respect to the background can further complicate the detection. Overcoming these limitations usually requires complex experimental setups or additional fabrication steps.
A team led by Prof. Mervi Paulasto-Kröckel from Aalto University has shown that SEM imaging can be used to accurately detect in-plane movements with a resolution of a few nanometers. In recently published work, researchers show accurate motion detection below 100 nm in amplitude and up to 320 kHz in frequency.
Our nanoprobing solution was used in this study to actuate the MEMS samples.
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