News

Thank you and we wish you all the best for 2020!

For our 10 years anniversary, we are very excited to unveil our new logo!

The November 2019 issue of the Electronic Device Failure Analysis (EDFA) magazine features the article Faster and more accurate failure analysis: circuit editing and short localization performed at same FIB tilt angle using multiple techniques, a joint publication from Imina Technologies, Switzerland and Fraunhofer IMWS, Germany.

Awesome days here in Lausanne with our distributors from all over the world! Lots of constructive exchanges and experience sharing to better serve our customers.

Imina Technologies partners with Angstrom Scientific Inc. to expand its sales and service network in the USA.

The versatile nanoprobing solutions from Imina Technologies were successfully used to characterize CMOS transistors of commercial microprocessors with technology nodes 22, 14, and 10 nm.