News

Imina Technologies partners with Apollowave to expand its network in Japan.

A new control unit that improves nanoprobes positioning resolution and versatility of MICRO and NANO product lines.

New use case about the Electron Beam Induced Resistance Change technique.

A complete redesign and new content to better serve you.

Release of the Large Sample Adapter option for nanoprobing and FA.

Finfocus Instruments Oy will deal with sales and support for Finland.

Thank you and we wish you all the best for 2020!

For our 10 years anniversary, we are very excited to unveil our new logo!

The November 2019 issue of the Electronic Device Failure Analysis (EDFA) magazine features the article Faster and more accurate failure analysis: circuit editing and short localization performed at same FIB tilt angle using multiple techniques, a joint publication from Imina Technologies, Switzerland and Fraunhofer IMWS, Germany.

Awesome days here in Lausanne with our distributors from all over the world! Lots of constructive exchanges and experience sharing to better serve our customers.